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→子系统 Subsystem
子系统表述为一个系统对象，该系统对象包含定义了系统所控制操作环境的特征的信息。<ref>IBM's definition @ http://www.ibm.com/support/knowledgecenter/ssw_i5_54/rzaks/rzakssbsd.htm</ref>数据测试用于验证各个子系统配置数据的准确性（例如MA长度、静态速度曲线、…），有一个单个子系统关联了这些子系统，以测试其特定应用（SA）。<ref>{{Cite book|title=European Committee for Electrotechnical Standardization (CENELEC) - EN 50128|last=|first=|publisher=CENELEC|year=2011|isbn=|location=Brussels, Belgium|pages=Table A.11 – Data Préparation Techniques (8.4)}}</ref>
子系统表述为一个系统对象，该系统对象包含定义了系统所控制操作环境的特征的信息。<ref>IBM's definition @ http://www.ibm.com/support/knowledgecenter/ssw_i5_54/rzaks/rzakssbsd.htm</ref>数据测试用于验证各个子系统配置数据的准确性（例如MA长度、静态速度曲线、…），有一个单个子系统关联了这些子系统，以测试其特定应用（SA）。<ref>{{Cite book|title=European Committee for Electrotechnical Standardization (CENELEC) - EN 50128|last=|first=|publisher=CENELEC|year=2011|isbn=|location=Brussels, Belgium|pages=Table A.11 – Data Préparation Techniques (8.4)}}</ref>
--[[用户:Stefanie|Stefanie]]（[[用户讨论:Stefanie |讨论]]） 【审校】“ 有一个单个子系统关联了这些子系统，以测试其特定应用（SA）。”改为“它们和单个子系统关联，以测试其具体应用。”
A subsystem description is a system object that contains information defining the characteristics of an operating environment controlled by the system.<ref>IBM's definition @ http://www.ibm.com/support/knowledgecenter/ssw_i5_54/rzaks/rzakssbsd.htm</ref> The Data tests are performed to verify the correctness of the individual subsystem configuration data (e.g. MA Length, Static Speed Profile, …) and they are related to a single subsystem in order to test its Specific Application (SA).<ref>{{Cite book|title=European Committee for Electrotechnical Standardization (CENELEC) - EN 50128|last=|first=|publisher=CENELEC|year=2011|isbn=|location=Brussels, Belgium|pages=Table A.11 – Data Préparation Techniques (8.4)}}</ref>
A subsystem description is a system object that contains information defining the characteristics of an operating environment controlled by the system.<ref>IBM's definition @ http://www.ibm.com/support/knowledgecenter/ssw_i5_54/rzaks/rzakssbsd.htm</ref> The Data tests are performed to verify the correctness of the individual subsystem configuration data (e.g. MA Length, Static Speed Profile, …) and they are related to a single subsystem in order to test its Specific Application (SA).<ref>{{Cite book|title=European Committee for Electrotechnical Standardization (CENELEC) - EN 50128|last=|first=|publisher=CENELEC|year=2011|isbn=|location=Brussels, Belgium|pages=Table A.11 – Data Préparation Techniques (8.4)}}</ref>